Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM)

High temperature scanning probe microscopy at in operando conditions at temperatures up to 850°C in reducing and oxidizing atmospheres is a relatively new technique. The unique controlled atmosphere high temperature scanning probe microscopes are used for studying electrical and electrochemical properties of metal and metal oxide surfaces on a submicron scale.

Localized probing techniques such as AC conductance mapping, local impedance spectroscopy and Kelvin probe force microscopy are used for elucidating solid oxide cell degradation mechanisms and surface reactions. The ability to combine electrical information with chemical and microstructural information from other techniques on a submicron scale gives a more complete and detailed picture of the surface properties..