Conference paper
Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling
In
Proceedings of the Ieee International Reliability Physics Symposium (irps 2017)
—
2017, pp. 2F-4.1-2F-4.10
Abstract
We investigated the effects of electrical stress and thermal storage by means of photocurrent, Impedance Spectroscopy and Open Circuit Voltage Decay models. The electrical stress damages only the active layer, by reducing the generation rate, the polaron separation probability and the carrier lifetime.
The thermal stress also degrades the anode interface. This reflects on the appearance of an inflection in the I-V photocurrent shape close to the operative region.
| Language: | English |
|---|---|
| Publisher: | IEEE |
| Year: | 2017 |
| Pages: | 2F-4.1-2F-4.10 |
| Proceedings: | 2017 IEEE International Reliability Physics Symposium |
| ISBN: | 1509066411 , 150906642X , 150906642x , 9781509066414 , 9781509066421 , 1509066403 and 9781509066407 |
| ISSN: | 15417026 and 19381891 |
| Types: | Conference paper |
| DOI: | 10.1109/IRPS.2017.7936274 |
| ORCIDs: | Krebs, Frederik C and Gevorgyan, Suren A. |
