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Conference paper

Dynamics of Nanostructures: A quantitative approach using in situ Electron Microscopy

By Hansen, Thomas Willum1; Liu, Pei1; Madsen, Jacob2; Nielsen, Monia Runge1; Schiøtz, Jakob2,3; Wagner, Jakob B.1

From

Center for Electron Nanoscopy, Technical University of Denmark1

Department of Physics, Technical University of Denmark2

Computational Atomic-scale Materials Design, Department of Physics, Technical University of Denmark3

Language: English
Year: 2018
Proceedings: 69th Annual Conference of the Nordic Microscopy Society
Types: Conference paper
ORCIDs: Hansen, Thomas Willum , Liu, Pei , Schiøtz, Jakob and Wagner, Jakob B.
Keywords

Electron beam effects In situ TEM Nano particles Quantitative analysis

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Analysis