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Conference paper

Elevated temperature in-situ transmission Kikuchi diffraction: a powerful tool for the characterization of ultra-thin metal films for nanofabrication applications

From

Center for Electron Nanoscopy, Technical University of Denmark1

DTU Danchip, Technical University of Denmark2

Language: English
Year: 2018
Proceedings: 69th Annual Conference of the Nordic Microscopy Society
Types: Conference paper
ORCIDs: Jansen, Henri , Wagner, Jakob B. and Han, Anpan

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Analysis