Conference paper
Very High Frequency Two-Port Characterization of Transistors
To properly use transistors in VHF converters, they need to be characterized under similar conditions. This research presents a two-port method, using a network analyzer (NWA) with a S-port setup. The method is a one-shot method, providing fast results of the off-state parasitics of the transistors.
Language: | English |
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Year: | 2016 |
Proceedings: | 5th International Workshop on Power Supply On Chip |
Types: | Conference paper |
ORCIDs: | Hertel, Jens Christian , Nour, Yasser , Jørgensen, Ivan Harald Holger and Knott, Arnold |