Conference paper
Very High Frequency Two-Port Characterization of Transistors
Abstract
To properly use transistors in VHF converters, they need to be characterized under similar conditions. This research presents a two-port method, using a network analyzer (NWA) with a S-port setup. The method is a one-shot method, providing fast results of the off-state parasitics of the transistors.
| Language: | English |
|---|---|
| Year: | 2016 |
| Proceedings: | 5th International Workshop on Power Supply On Chip |
| Types: | Conference paper |
| ORCIDs: | Hertel, Jens Christian , Nour, Yasser , Jørgensen, Ivan Harald Holger and Knott, Arnold |
